Mentor Graphics Announces Automated Functionality for Achieving Optimal Test Coverage Results in its FastScan and TestKompress Design-for-Test Tools
WILSONVILLE, Ore.—(BUSINESS WIRE)—Oct. 5, 2004—
Mentor Graphics Corporation (Nasdaq:MENT) today
announced new automated functionality in its industry-leading
automatic test pattern generation tool (ATPG), FastScan(TM), and its
TestKompress(R) embedded deterministic test tool. The ATPG Expert
feature automatically analyzes the design and manages all the
complexities of test pattern generation to achieve optimal results in
terms of test coverage, pattern count and run times.
As design processes move to nanometer geometries, selecting the
most effective ATPG parameters to achieve desired results can be a
daunting task. The ATPG Expert feature works as an internal "expert"
within the FastScan or TestKompress tools to automatically analyze the
design and make the decisions needed to produce the best results. It
manages test generation complexities, such as how to deal with RAM
shadow logic, and determines the sequential depth or abort limits to
set, the types of compression to exploit, and how to handle clock
interactions and bus contention. The result is higher coverage,
minimal pattern count and optimized run times.
"The move to nanometer design brings with it a number of new
complexities and uncertainties. By automating more of the ATPG
process, our goal is to add certainty and to simplify the process of
achieving optimal test results," said Robert Hum, vice president and
general manager, Design Verification and Test division, Mentor
Graphics. "We incorporate the same functionality available in the
FastScan tool into the TestKompress tool so customers can easily adopt
and integrate these tools into their design flow for comprehensive and
scalable test solution."
About FastScan and TestKompress
The FastScan and TestKompress tools are the most advanced ATPG
tools available. Easily integrated into any standard design flow, they
provide the highest test coverage while dramatically reducing
test-pattern-generation time. Both tools offer a wide range of fault
models and pattern types for more thorough testing, comprehensive
design rules checks, and innovative algorithms for
performance-oriented pattern compaction. Based on the ATPG
methodology, the TestKompress tool features dramatic compression
capabilities designed to reduce test data volume by up to 100X while
improving test quality and cost. The ATPG Expert feature is available
in the current versions of both tools. For more information visit
www.mentor.com/dft.
About Mentor Graphics
Mentor Graphics Corporation (Nasdaq:MENT) is a world leader in
electronic hardware and software design solutions, providing products,
consulting services and award-winning support for the world's most
successful electronics and semiconductor companies. Established in
1981, the company reported revenues over the last 12 months of about
$675 million and employs approximately 3,800 people worldwide.
Corporate headquarters are located at 8005 S.W. Boeckman Road,
Wilsonville, Oregon 97070-7777; Silicon Valley headquarters are
located at 1001 Ridder Park Drive, San Jose, California 95131-2314.
World Wide Web site: http://www.mentor.com/.
Mentor Graphics and Testkompress are registered trademarks and
FastScan is a trademark of Mentor Graphics Corporation. All other
company or product names are the registered trademarks or trademarks
of their respective owners.
Contact:
Mentor Graphics
Leanne White, 503-685-1984
leanne_white@mentor.com
or
Suzanne Graham, 503-685-7789
suzanne_graham@mentor.com
